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2001

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Supplement

  

Quantum dots and wells, mesoscopic networks


Submicron charge-density-wave devices

 а,  а, б,  а
а Delft University of Technology, Delft, The Netherlands
б Department of Physics, Harvard University, Oxford Street, 17 Cambridge, MA, 02138, United States of America , Cambridge, MA, США

We review our fabrication methods to produce submicron charge-density-wave (CDW) structures and present measurements of CDW dynamics on a microscopic scale. Our data show that mesoscopic CDW dynamics is different from bulk behavior. We have studied current-conversion and found a size-effect that can not be accounted for by existing models. An explanation might be that the removal and addition of wave fronts becomes correlated in time when probe spacing is reduced below a few $\mu$m. On small segments we occasionally observe negative differential resistance in the $I(V)$ characteristics and sometimes the resistance may even become negative. We believe that the interplay between CDW deformations (strain) and quasi-particles may yield non-equilibrium effects that play a crucial role in this new phenomenon. No detailed theoretical calculations are available. Our measurements clearly show the need of a microscopic model for CDW dynamics.

Текст pdf (219 Кб)
English fulltext is available at DOI: 10.1070/1063-7869/44/10S/S12
PACS: 73.63.−b, 73.21.−b, 68.65.−k, 71.35.−y (все)
DOI: 10.1070/1063-7869/44/10S/S12
URL: https://ufn.ru/ru/articles/2001/13/l/
Цитата: van der Zant H S, Marković Nina, Slot E "Submicron charge-density-wave devices" УФН 171 61–65 (2001)
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Русский English
TY JOUR
TI Submicron charge-density-wave devices
AU van der Zant, H. S.
AU Marković Nina
AU Slot, E.
PB Uspekhi Fizicheskikh Nauk
PY 2001
JO Uspekhi Fizicheskikh Nauk
JF Uspekhi Fizicheskikh Nauk
JA Usp. Fiz. Nauk
VL 171
IS 13
SP 61-65
UR https://ufn.ru/ru/articles/2001/13/l/
ER https://doi.org/10.1070/1063-7869/44/10S/S12

English citation: van der Zant H S, Marković Nina, Slot E “Submicron charge-density-wave devicesPhys. Usp. 44 61–65 (2001); DOI: 10.1070/1063-7869/44/10S/S12

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