Issues

 / 

1973

 / 

April

  

Reviews of topical problems


Mass analysis and field-ion microscopy

The review discusses methods of mass-spectrometric analysis of particles extracted from a field-ion microscope, for the purpose of developing the theory and practice of field-ion microscopy research. The theoretical and experimental aspects of the probe-analysis procedure are discussed. The results of the principal work done in this field are used for the purpose of extending the existing ideas concerning the autoionization, field-evaporation, and formation of field-ion images.

Fulltext pdf (1.5 MB)
Fulltext is also available at DOI: 10.1070/PU1973v015n04ABEH004996
PACS: 79.70.+q, 68.37.Vj, 32.80.Dz (all)
DOI: 10.1070/PU1973v015n04ABEH004996
URL: https://ufn.ru/en/articles/1973/4/g/
Citation: Suvorov A L, Trebukhovskii V V "Mass analysis and field-ion microscopy" Sov. Phys. Usp. 15 471–485 (1973)
BibTexBibNote ® (generic)BibNote ® (RIS) MedlineRefWorks
PT Journal Article
TI Mass analysis and field-ion microscopy
AU Suvorov A L
FAU Suvorov AL
AU Trebukhovskii V V
FAU Trebukhovskii VV
DP 10 Apr, 1973
TA Phys. Usp.
VI 15
IP 4
PG 471-485
RX 10.1070/PU1973v015n04ABEH004996
URL https://ufn.ru/en/articles/1973/4/g/
SO Phys. Usp. 1973 Apr 10;15(4):471-485

Оригинал: Суворов А Л, Требуховский В В «Масс-анализ в автоионной микроскопии» УФН 107 657–683 (1972); DOI: 10.3367/UFNr.0107.197208e.0657

© 1918–2024 Uspekhi Fizicheskikh Nauk
Email: ufn@ufn.ru Editorial office contacts About the journal Terms and conditions